InAlN is grown epitaxially by metalorganic chemical vapour deposition[3] or molecular beam epitaxy[4] in combination with other semiconductor materials such as gallium nitride, aluminium nitride and their associated alloys to produce semiconductor wafers, which are then used as the active component in semiconductor device manufacture. InAlN is an especially difficult material to grow epitaxially due to the widely different properties of aluminium nitride and indium nitride,[5] and the resulting narrow window for optimised growth can lead to contamination (i.e. to produce indium gallium aluminium nitride) and poor crystal quality,[6] at least when compared to AlGaN. Similarly, device fabrication techniques optimised for AlGaN devices may require adjustment to account for the different material properties of InAlN [7]
References
^Maier, D.; Alomari, M.; Grandjean, N.; Carlin, J.-F.; Diforte-Poisson, M.-A.; et al. (2012). "InAlN/GaN HEMTs for Operation in the 1000°C Regime: A First Experiment". IEEE Electron Device Letters. 33 (7). Institute of Electrical and Electronics Engineers (IEEE): 985–987. Bibcode:2012IEDL...33..985M. doi:10.1109/led.2012.2196972. ISSN0741-3106. S2CID328833.
^Smith, M D; O’Mahony, D; Vitobello, F; Muschitiello, M; Costantino, A; et al. (2015-12-14). "A comparison of the 60Co gamma radiation hardness, breakdown characteristics and the effect of SiNx capping on InAlN and AlGaN HEMTs for space applications". Semiconductor Science and Technology. 31 (2). IOP Publishing: 025008. doi:10.1088/0268-1242/31/2/025008. ISSN0268-1242.
^Xue, JunShuai; Hao, Yue; Zhou, XiaoWei; Zhang, JinCheng; Yang, ChuanKai; et al. (2011). "High quality InAlN/GaN heterostructures grown on sapphire by pulsed metal organic chemical vapor deposition". Journal of Crystal Growth. 314 (1). Elsevier BV: 359–364. Bibcode:2011JCrGr.314..359X. doi:10.1016/j.jcrysgro.2010.11.157. ISSN0022-0248.
^Higashiwaki, M., et al, (2006), Molecular Beam Epitaxy, 2002 International Conference on, p. 235
^Smith, Matthew D.; Sadler, Thomas C.; Li, Haoning; Zubialevich, Vitaly Z.; Parbrook, Peter J. (2013-08-19). "The effect of a varied NH3 flux on growth of AlN interlayers for InAlN/GaN heterostructures". Applied Physics Letters. 103 (8). AIP Publishing: 081602. Bibcode:2013ApPhL.103h1602S. doi:10.1063/1.4818645. hdl:10468/4280. ISSN0003-6951.
^Smith, M. D.; O'Mahony, D.; Conroy, M.; Schmidt, M.; Parbrook, P. J. (2015-09-14). "InAlN high electron mobility transistor Ti/Al/Ni/Au Ohmic contact optimisation assisted by in-situ high temperature transmission electron microscopy". Applied Physics Letters. 107 (11). AIP Publishing: 113506. Bibcode:2015ApPhL.107k3506S. doi:10.1063/1.4930880. ISSN0003-6951.