Nanosensors (company)

Nanosensors
Product type	Nanotechnology; AFM probes; AFM tips; AFM cantilevers
Owner	NanoWorld
Introduced	1993
Markets	Worldwide
Tagline	The World Leader in Scanning Probes
Website	www.nanosensors.com

Nanosensors Inc. is a company that manufactures probes for use in atomic force microscopes (AFM) and scanning probe microscopes (SPM). This private, for profit company was founded November 21, 2018. Nanosensors Inc. is located in Neuchatel, Switzerland.

History

Nanosensors was founded as "Nanoprobe" in 1990,^[1] building on research conducted at IBM Sindelfingen on fundamental technologies required for the batch processing of silicon AFM probes using bulk micromachining.

In 1993, Nanosensors commercialized SPM and AFM probes worldwide. Their developments in batch processing technologies for producing AFM probes contributed to introducing Atomic Force Microscopes into the industry of the time. In recognition of this achievement, Nanosensors discerned the Dr.-Rudolf-Eberle Innovation Award of the German State of Baden-Württemberg^[2] and the Innovation Prize of the German Industry ^[3] in 1995 and the Innovation Award of the Förderkreis für die Mikroelektronik e.V.^[4] in 1999.

In 2002, Nanosensors was acquired by and integrated into Switzerland-based NanoWorld. It is still an independent business unit.

Significance

Researchers have developed an array of operating modes and methods for Scanning probe microscopy and Atomic Force Microscopy. The use and application of such methods requires SPM or AFM instruments equipped with method-specific SPM or AFM probes. Nanosensors supplies SPM or AFM users worldwide with a range of such method-specific SPM or AFM probes.^[5]

Products

AFM Probe Series

PointProbePlus

The PointProbePlus series is directly based on the technology originally developed and commercialized by Nanosensors in 1993. The original PointProbe technology has been upgraded to the PointProbePlus technology in 2004 yielding a reduced variation of tip shape and increased reproducibility of images. It is manufactured from highly doped mono-crystalline silicon. The tip is pointing into the <100> crystal direction.

PointProbePlus XY-Alignment Series & Alignment Chip
PointProbePlus Silicon MFM Probe Series^[6]^[7]
SuperSharpSilicon^[8]^[9]
High Aspect Ratio AFM probes^[10]

AdvancedTEC

The tip of the AdvancedTEC AFM probe series^[11] protrudes from the end of the cantilever and is visible through the optical system of the atomic force microscope. This visibility from the top allows the operator of the microscope to position the tip of this AFM probe at the point of interest.

Akiyama-Probe^[12]

References

^ "The History of NANOSENSORS™ - R&D Leaders in AFM Probes Since 1990". www.nanosensors.com. Retrieved 2023-04-26.
^ Dr.-Rudolf-Eberle-Preis – Innovationspreis des Landes Baden Württemberg, Auszeichungen, Preisträger 1995
^ Innovationspreis der deutschen Wirtschaft, Erster Innovationspreis der Welt, Preisträger der Vorjahre, 1995
^ Annual Innovation Award of the Förderkreis Mikroelektronik, Industrie- und Handelskammer Nürnberg für Mittelfranken
^ Stevens, R. M. (2009). "New carbon nanotube AFM probe technology". Materials Today. 12 (10): 42–86. doi:10.1016/S1369-7021(09)70276-7.
^ Scott, J.; McVitie, S.; Ferrier, R. P.; Gallagher, A. (2001). "Electrostatic charging artefacts in Lorentz electron tomography of MFM tip stray fields" (PDF). Journal of Physics D: Applied Physics. 34 (9): 1326. Bibcode:2001JPhD...34.1326S. doi:10.1088/0022-3727/34/9/307.
^ Pulwey, R.; Rahm, M.; Biberger, J.; Weiss, D. (2001). "Switching behavior of vortex structures in nanodisks". IEEE Transactions on Magnetics. 37 (4): 2076. Bibcode:2001ITM....37.2076P. doi:10.1109/20.951058.
^ Xiaohui Tang; Bayot, V.; Reckinger, N.; Flandre, D.; Raskin, J. -P.; Dubois, E.; Nysten, B. (2009). "A Simple Method for Measuring Si-Fin Sidewall Roughness by AFM". IEEE Transactions on Nanotechnology. 8 (5): 611. Bibcode:2009ITNan...8..611T. doi:10.1109/TNANO.2009.2021064. S2CID 22152956.
^ Sobchenko, I.; Pesicka, J.; Baither, D.; Stracke, W.; Pretorius, T.; Chi, L.; Reichelt, R.; Nembach, E. (2007). "Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles" (PDF). Philosophical Magazine. 87 (17): 2427. Bibcode:2007PMag...87.2427S. doi:10.1080/14786430701203184. S2CID 137216435.
^ Juang, B. J.; Huang, K. Y.; Liao, H. S.; Leong, K. C.; Hwang, I. S. (2010). "AFM pickup head with holographic optical element (HOE)". 2010 IEEE/ASME International Conference on Advanced Intelligent Mechatronics. p. 442. doi:10.1109/AIM.2010.5695758. ISBN 978-1-4244-8031-9. S2CID 17204425.
^ Bolopion, A.; Hui Xie; Haliyo, D. S.; Regnier, S. (2010). "3D haptic handling of microspheres". 2010 IEEE/RSJ International Conference on Intelligent Robots and Systems (PDF). p. 6131. doi:10.1109/IROS.2010.5650443. ISBN 978-1-4244-6674-0. S2CID 14197333.
^ Trumper, D. L.; Hocken, R. J.; Amin-Shahidi, D.; Ljubicic, D.; Overcash, J. (2011). "High-Accuracy Atomic Force Microscope". Control Technologies for Emerging Micro and Nanoscale Systems. Lecture Notes in Control and Information Sciences. Vol. 413. p. 17. doi:10.1007/978-3-642-22173-6_2. ISBN 978-3-642-22172-9.

External links

www.nanosensors.com

[1] "The History of NANOSENSORS™ - R&D Leaders in AFM Probes Since 1990". www.nanosensors.com. Retrieved 2023-04-26.

[2] Dr.-Rudolf-Eberle-Preis – Innovationspreis des Landes Baden Württemberg, Auszeichungen, Preisträger 1995

[3] Innovationspreis der deutschen Wirtschaft, Erster Innovationspreis der Welt, Preisträger der Vorjahre, 1995

[4] Annual Innovation Award of the Förderkreis Mikroelektronik, Industrie- und Handelskammer Nürnberg für Mittelfranken

[doi10.1016/S1369-70210970276-7-5] Stevens, R. M. (2009). "New carbon nanotube AFM probe technology". Materials Today. 12 (10): 42–86. doi:10.1016/S1369-7021(09)70276-7.

[6] Scott, J.; McVitie, S.; Ferrier, R. P.; Gallagher, A. (2001). "Electrostatic charging artefacts in Lorentz electron tomography of MFM tip stray fields" (PDF). Journal of Physics D: Applied Physics. 34 (9): 1326. Bibcode:2001JPhD...34.1326S. doi:10.1088/0022-3727/34/9/307.

[7] Pulwey, R.; Rahm, M.; Biberger, J.; Weiss, D. (2001). "Switching behavior of vortex structures in nanodisks". IEEE Transactions on Magnetics. 37 (4): 2076. Bibcode:2001ITM....37.2076P. doi:10.1109/20.951058.

[8] Xiaohui Tang; Bayot, V.; Reckinger, N.; Flandre, D.; Raskin, J. -P.; Dubois, E.; Nysten, B. (2009). "A Simple Method for Measuring Si-Fin Sidewall Roughness by AFM". IEEE Transactions on Nanotechnology. 8 (5): 611. Bibcode:2009ITNan...8..611T. doi:10.1109/TNANO.2009.2021064. S2CID 22152956.

[9] Sobchenko, I.; Pesicka, J.; Baither, D.; Stracke, W.; Pretorius, T.; Chi, L.; Reichelt, R.; Nembach, E. (2007). "Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles" (PDF). Philosophical Magazine. 87 (17): 2427. Bibcode:2007PMag...87.2427S. doi:10.1080/14786430701203184. S2CID 137216435.

[10] Juang, B. J.; Huang, K. Y.; Liao, H. S.; Leong, K. C.; Hwang, I. S. (2010). "AFM pickup head with holographic optical element (HOE)". 2010 IEEE/ASME International Conference on Advanced Intelligent Mechatronics. p. 442. doi:10.1109/AIM.2010.5695758. ISBN 978-1-4244-8031-9. S2CID 17204425.

[11] Bolopion, A.; Hui Xie; Haliyo, D. S.; Regnier, S. (2010). "3D haptic handling of microspheres". 2010 IEEE/RSJ International Conference on Intelligent Robots and Systems (PDF). p. 6131. doi:10.1109/IROS.2010.5650443. ISBN 978-1-4244-6674-0. S2CID 14197333.

[12] Trumper, D. L.; Hocken, R. J.; Amin-Shahidi, D.; Ljubicic, D.; Overcash, J. (2011). "High-Accuracy Atomic Force Microscope". Control Technologies for Emerging Micro and Nanoscale Systems. Lecture Notes in Control and Information Sciences. Vol. 413. p. 17. doi:10.1007/978-3-642-22173-6_2. ISBN 978-3-642-22172-9.

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